| Automated semiconductor
test equipment is available to characterize most types of semiconductor
components from simple discrete devices such as transistors and diodes,
to complex hybrid, linear, and digital integrated circuits.
Specific test systems available include:
- Tektronix S-3260 Digital Integrated
Circuit Test system
- Lorlin, IMPACT-II, Discrete
Device Test System
- Analog Devices, LTS-2012, Analog Device Test System
- HiLevel, ETS-360, Digital Integrated Circuit Test system
- IMS, XTS, Integrated Circuit Test
System
- In addition, BREL has an extensive laboratory instrumentation inventory
for supporting radiation characterization testing efforts. The instruments
may be used stand-alone or integrated into a custom configuration under
computer control using National Instruments
LabVIEW programming language.
Data analysis software and interface hardware are available to:
- Transfer test data from any measurement system to a common database
- Provide easy comparison of parameter changes with increasing radiation
levels
- Calculate statistical values for each parameter and test level
- Group results of like parameters to obtain data compression
- Check measured results against specification limits
- Flag failing samples and parameters
- Generate worst case design limits
- Transfer data to personal or mainframe computers for document-quality
graphs of further data analysis
BREL has an extensive component database and index with over 1500 entries
available to:
- Identify components previously tested
- Locate existing test data or test reports
- Provide quick reference to similar components previously tested to
allow efficient software and hardware development for new test items
- Support survivability/vulnerability assessments of circuits and subsystems
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