- "Single
Event Effects in Avionics"
Presentation by E. Normand, December 1998,
to the C-17 Avionics Group
- "Experience
and Capabilities of the Boeing Radiation Effects Laboratory (BREL) to Support
the RSS Program"
Presentation by E. Normand, December 1998, to:
- Reusable Space Systems, Avionics and EME Groups (Downey)
- Boeing Research
and Technology Center and SBIRS-Low (Anaheim)
- GPS and Ellipso Programs
(Seal Beach)
- P. P. Majewski, E. Normand and D. L. Oberg,
"A New Solar Flare Heavy Ion Model
and Its Implementation Through MACREE, An Improved Modeling Tool to Calculate
Single Event Effect Rates in Space,"
IEEE Trans. Nucl. Sci., 42, 2043,
(1995)
- E. Normand, D. L. Oberg, J. L. Wert, P. P. Majewski,
G. A. Woffinden, S. Satoh, K. Sasaki, M. G. Tverskoy, V. V. Miroshkin, N. Goleminov,
S. A. Wender and A. Gavron,
"Comparison
of Charge Collection Measurements in Silicon and InGaAs Irradiated by Energetic
Protons and Neutrons,"
IEEE Trans. Nucl. Sci., 42, 1815, (1995)
- E. Normand, J. L. Wert, D. L. Oberg, P. P. Majewski, W. G. Bartholet,
S. K. Davis, M. Shoga, S. A. Wender and A. Gavron,
"Single
Event Upset and Latchup Measurements in Avionics Devices Using the WNR Neutron
Beam and a New Neutron-Induced Latchup Model," Workshop Record,
1995 IEEE
Radiation Effects Data Workshop, p. 33
- E. Normand, "Single
Event Upset at Ground Level," IEEE Trans. Nucl. Sci., 43, 2742, (1996)
- E. Normand, "Single Event
Effects in Avionics," IEEE Trans. Nucl. Sci., 43, 461, (1996)
-
E. Normand, J.L. Wert, D. L. Oberg, P. P. Majewski, P.Voss, and S. A. Wender,
"Neutron-Induced
Single Event Burnout in High Voltage Electronics,"
IEEE Trans. Nucl. Sci.,
44, 2358, (1997)
- E. Normand,
"Extensions
of the Burst Generation Rate Method for Wider Application to Proton/Neutron-Induced
Single Event Effects,"
IEEE Trans. Nucl. Sci, 45, 2904, 1998
- D.L. Oberg, J.L. Wert, E. Normand, P.P. Majewski, and S.A. Wender,
"First Observations of Power MOSFET Burnout with High Energy
Neutrons,"
IEEE Trans. Nucl. Sci., 43, 2913, (1996)
-
D.L. Oberg, J.L. Wert, E. Normand, J.D. Ness, P.P. Majewski, and R.A. Kennerud,
"Measurement of Single Event Effects in the 87C51 Microcontroller,"
IEEE Radiation Effects Data Workshop Proceedings, 43-50, 1993
-
D.L. Oberg & J.L. Wert,
"First Non-destructive Measurements
of Power MOSFET Burnout Cross sections,"
IEEE Trans. Nuc Sci., NS-34,
1736-1741, December 1987
|
