Radiation Effects Database
BREL has an extensive radiation database that contains total dose, single event effects and displacement damage effects test data on a wide variety of semiconductor device types. However, contractual restrictions as well as other liability issues prevent making this database available to outside organizations. The database can be used by qualified Boeing programs as a preliminary aid to semiconductor part selection, to evaluate expected radiation effects on various semiconductor technology and function types, and to identify areas of potential concern where additional testing is warranted in order to reduce the risk of radiation induced failures.
Regardless of the data source, all radiation test data should be used with caution. Ground-based radiation simulation tests must be tailored to take into account the specific mission requirements, expected particle types, energy distributions and fluxes, mission life, and other factors such as exposure rate, time and temperature profiles, that can drastically affect the applicability of test data. Users must also be aware that semiconductor manufacturers can and do frequently change fabrication processes, and radiation test results can vary widely from one lot to another. In addition, the same generic part made by two different manufacturers can have widely different radiation sensitivities even though the parts are otherwise fit, form and function identical. Finally, hybrid and multi-chip module devices present special problems in analyzing or testing for radiation sensitivity due to the uncertain regarding the actual source and pedigree of individual semiconductor die used, and the physical size and makeup of the hybrid package.