Boeing Radiation Effects Laboratory (BREL)

Instrumentation

The BREL Automated Test Equipment (ATE) Laboratory

The BREL Automated Test Equipment (ATE) Laboratory is a 1,400 ft2, class 1,500,000 clean room (per BAC 5703) that accommodates a wide range of computer controlled electrical component testers.

Automated semiconductor test equipment is available to characterize most types of semiconductor components from simple discrete devices such as transistors and diodes, to complex hybrid, linear, and digital integrated circuits.

Specific test systems available include:

  • IMS ATS-II Blazer, digital integrated circuit test system
  • Testronix 201C, discrete component tester
  • Teradyne Micro-Flex mix-signal test system
  • Analog Devices, LTS-2015, analog device test system
  • HiLevel, Griffin 868, digital integrated circuit test system
  • In addition, BREL has an extensive laboratory instrumentation inventory (general purpose test equipment) for supporting radiation characterization testing efforts. These instruments may be used stand-alone or integrated into a custom configuration under computer control using National Instruments LabVIEW programming language.

Software is available to:

  • Transfer test data from any measurement system to a common database
  • Provide easy comparison of parameter changes with increasing radiation levels
  • Calculate statistical values for each parameter and test level
  • Group results of like parameters to obtain data compression and ease data review times
  • Check measured results against specification limits
  • Flag failing samples and parameters
  • Generate worst case design limits
  • Transfer data to personal computers for document-quality graphs and for further data analysis

BREL has an extensive component database and index available to BREL personnel to:

  • Identify components previously tested
  • Locate existing test data or test reports
  • Provide quick reference to similar components previously tested to allow efficient software and hardware development for new test items
  • Support survivability/vulnerability assessments of circuits and subsystems