Boeing Technology Services - Propulsion

Data Acquisition System

The Data Acquisition System (DAS) for the NTF is a Data General MV/18000 SX model 10, 32 bit processor. The DAS front end consists of a variety of data acquisition hardware including a 15 bit high-speed Analog to Digital Converter (ADC)(100 kHz)and an electronic pressure scanner (EPS). The EPS is made by Scanivalve Incorporated (HYSCAN). The DAS interfaces with the ADC via a 16-bit parallel interface and the EPS via IEEE 488.

Data System Specifications

  • 143 channels of analog data (i.e., pressure transducers and thermocouples) that are sampled via the ADC
  • 256 pneumatic channels sampled via EPS
    • 16 Modules (16 pressures each) with pressure ranges (15, 30, 50, 100 psid)
    • Data Accuracy ±0.1% of reading
  • 100 (Cell 1) and 239 (Cell 2) thermocouple channels sampled via HP3852A Temperature Scanner
  • Real time displays of data parameters as well as calculations
  • Commands via keyboard, touchscreen or remote handhelds
  • Dynamic Data Acquisition System available

NTF Facility Parameters

Cell 1

  • Varies depending upon test rig

Cell 2

  • PREF -- Ambient Pressure (psia)
  • PAMB -- Cell Pressure (psia)
  • TAMB -- Ambient Cell Temperature
    Multiple Critical Venturi's (MCV)
  • PFM1P -- Primary Upstream Pressure (psia)
  • PFM2P -- Primary Downstream Pressure (psia)
  • PFM1S -- Secondary Upstream Pressure (psia)
  • PFM2S -- Secondary Downstream Pressure (psia)
  • AFI -- Axial Force
  • SFI1 2 -- Side Force 1 2
  • YMI -- Yaw Moment
  • PTAREP -- Primary Tare Pressure (psid)
  • PTARES -- Secondary Tare Pressure (psid)
  • PTARET -- Tertiary Tare Pressure (psid)
  • TTAREP -- Primary Tare Temperature (psid)
  • TTARES -- Secondary Tare Temperature (psid)
  • TTARET -- Tertiary Tare Temperature (psid)


If you would like to join the companies using the testing resources available at The Boeing Company, contact the Boeing Technology Services Marketing Manager Ms. Rosa Alvarez at 206-662-4287, request a quote online, or e-mail us for more information about our test capabilities.