Solid-State Electronics Development
Major ASIC Evaluation Resources Available at SSED
Digital/Analog/Mixed-signal
- Teradyne Digital Test System - 320 I/O @ 200 MHz
- IMS MSTS-f/t Digital/Mixed-signal IC Test System - 160 I/O @ 200MHz digital, 32 channels analog at 1GHz
- IMS ATS Digital Test System - 160 I/O @ 100MHz
- IMS XL-60 M/S Digital/Mixed-Signal IC Test System - 320 I/O @ 60MHz digital, 16 channels analog at 200MHz
- Micromanipulator Co. Inc. DC/LF microprobe station with dry chamber - 6" (150mm) thermal stage, -70° C to +400° C
- Alessi and Micromanipulator ambient DC/LF microprobe stations - 4" and 6" (100mm/150mm)
- Vast array of bench top source and measure equipment
RF/MMIC
- Agilent E8364A PNA - 50GHz bandwidth with Focus Microwaves Load-Pull system -50GHz
- Hewlett-Packard 8510C Network Analysis system - 50GHz bandwidth
- Hewlett-Packard 8970C Noise Measurement system - 40GHz bandwidth
- Cascade Microtech 11000 RF microprobe station with dry chamber - 6" (150mm) thermal stage, -70° C to +200° C
- Other bench top network, noise and spectrum analysis equipment
Related Services
- Thermotron S-1.2V thermal chamber, 1.2cu/ft capacity, -55° C to +150° C span, self-contained cooling
- Delta Design 9320 thermal chambers, 0.4 cu/ft capacity, -120° C to +300° C span, LN2 or LCO2 cooling
- Temptronics TPO4300A temperature forcing system, -70° C to +200° C span, self-contained cooling
- New Wave Research EZ-Laze Laser Micro-machining system - 3 wavelengths, 1064nm (IR), 532nm (green), 355nm (UV)
- Disco 320 Wafer Dicing Saw, dicing up to 8" (200mm)
- Electroglas 2001X Automated Wafer Probe system - up to 6" (150mm) wafers
- PC/National Instruments LabView based GPIB and VXI bus control systems
Note: All registers and trademarks are the property of their respective companies. Presentation of these tools does not reflect an endorsement of or an obligation to support these products. Tool availability should be discussed prior to beginning any ASIC development work.